Keysight Introduces Isolated Probing Technology for Fast-Switching Power Device Testing

  • Enables accurate and safe measurement of floating circuits in high-voltage, noisy environments
  • Provides superior rejection of high common-mode voltages and accompanying noise to isolate small, fast-switching signals

Keysight Introduces Isolated Probing Technology for Fast-Switching Power Device Testing

Keysight Media Contacts

Andrea Mueller
Americas
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Fusako Dohi
Asia
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Jenny Gallacher
Europe
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Keysight Technologies, Inc. (NYSE: KEYS) has developed an optically isolated differential probing family dedicated to enhancing efficiency and performance testing of fast-switching devices such as wide bandgap GaN and SiC semiconductors. The new voltage probes will be displayed at Applied Power Electronics Conference (APEC) 2025 in Keysight’s booth (#829) along with Keysight’s MXR B and HD3 series of oscilloscopes.

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Keysight’s isolated differential probes provide up to 100 dB greater common-mode rejection than standard differential probes. (Photo: Business Wire)

Keysight’s isolated differential probes provide up to 100 dB greater common-mode rejection than standard differential probes. (Photo: Business Wire)

Validation of floating half-bridge and full-bridge architectures commonly used in power conversion, motor drives, and inverters requires measurement of small differential signals riding on high common-mode voltages. This measurement can be challenging due to voltage source fluctuations relative to ground, noise interference, and safety concerns. Isolated differential probes are galvanically isolated and reject common-mode voltages, enabling power electronics engineers to measure floating circuits accurately and safely in high-voltage, noisy environments. This technology will drive progress in efficiency and switching loss testing for high-voltage applications like electric vehicles (EVs), solar energy, battery management systems, and more.

Keysight’s isolated differential probes provide up to 10 billion times greater common-mode rejection than standard differential probes, making them ideal for high-voltage, high-side measurements. With up to 1 GHz bandwidth and a ±2,500 V differential voltage range, these probes enable accurate analysis of fast-switching GaN and SiC devices.

Robert Saponas, Vice President and General Manager of Keysight’s Digital and Photonics Center of Excellence, said: “Keysight recognizes the future of power integrated circuits going beyond Moore’s law, and we are committed to equipping our customers with the best power testing technology for their next breakthrough. Introducing Keysight’s isolated probes expands our suite of power solutions that streamline our customer's power integrity, supply, and efficiency testing workflow.”

Visit booth #829 at APEC to learn more about this new probing technology and other cutting-edge Keysight solutions, including power electronics modeling, device characterization, power integrity analysis, teaching labs, and power source emulation.

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About Keysight Technologies

At Keysight (NYSE: KEYS), we inspire and empower innovators to bring world-changing technologies to life. As an S&P 500 company, we’re delivering market-leading design, emulation, and test solutions to help engineers develop and deploy faster, with less risk, throughout the entire product life cycle. We’re a global innovation partner enabling customers in communications, industrial automation, aerospace and defense, automotive, semiconductor, and general electronics markets to accelerate innovation to connect and secure the world. Learn more at Keysight Newsroom and www.keysight.com.